In 1910 British physicist J. J. Thomson observed a release of positive ions and neutral atoms from a solid surface induced by ion bombardment. Improved vacuum pump technology in the 1940s enabled the first prototype experiments on SIMS by Herzog and Viehböck in 1949, at the University of Vienna, Austria. … Visa mer Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and … Visa mer Detection limits for most trace elements are between 10 and 10 atoms per cubic centimetre, depending on the type of instrumentation used, the primary ion beam used and the … Visa mer The COSIMA instrument onboard Rosetta was the first instrument to determine the composition of cometary dust in situ with secondary ion mass spectrometry during the spacecraft's … Visa mer • Benninghoven, A., Rüdenauer, F. G., Werner, H. W., Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental … Visa mer A secondary ion mass spectrometer consists of (1) a primary ion gun generating the primary ion beam, (2) a primary ion column, accelerating and focusing the beam onto the … Visa mer In the field of surface analysis, it is usual to distinguish static SIMS and dynamic SIMS. Static SIMS is the process involved in surface atomic monolayer analysis, or surface molecular analysis, usually with a pulsed ion beam and a time of flight mass spectrometer, while … Visa mer • NanoSIMS Visa mer Webb9 feb. 2016 · The popularity of argon gas cluster ion beams (Ar-GCIB) as primary ion beams in time-of-flight secondary ion mass spectrometry (TOF-SIMS) has increased because the molecular ions of large organic- and biomolecules can be detected with less damage to the sample surfaces.
ToF‐SIMS characterization of glyoxal surface oxidation products …
WebbSecondary ion mass spectrometry (SIMS) is a desorption mass spectrometry (MS) technique, and is widely used in industry and research. SIMS can be employed to obtain … Webb31 maj 2015 · In EI-MS nitrogen rule states: If a compound contains zero (or an even number of) nitrogen atoms, its molecular ion will be at an even mass number For SIMS … great podcasts 2023
TOF-SIMS: Accurate Mass Scale Calibration - ScienceDirect
WebbSIMS imaging. Secondary ion mass spectrometry (SIMS) is used to analyze solid surfaces and thin films by sputtering the surface with a focused primary ion beam and collecting … Webb1 dec. 2012 · To help analysts, the G-SIMS 2 method (from gentle-SIMS) was developed to simplify the spectra and provide direct interpretation based on the physics and … Webb2 sep. 2024 · 1 INTRODUCTION. In manual time-of-flight secondary ion mass spectrometry (ToF-SIMS) data analysis, the elucidation of sum formulas of unknown compounds in a sample starts with certain mass-to-charge (m/z) peaks in the mass spectrum and is aided by characteristic peak patterns.These patterns are formed during SIMS-specific … great podcasts 2021